
Measuring economic downside risk and severity : growth at risk / Yan Wang and Yudong Yao
Using growth at risk as a measure of downside growth risk, the authors find that higher perceived levels of downside growth risk seem to be negatively associated with long-term growth
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Main Authors: | Wang, Albert Yan |
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Corporate Authors: | World Bank Institute |
Outros Autores: | Yao, Yudong |
Formato: | Online-Resource |
Idioma: | English |
Publicado em: | Washington, D.C : World Bank, World Bank Institute, Economic Policy and Poverty Reduction Division, 2001 |
Colecção: | Policy research working paper
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Acesso em linha: | URL des Erstveröffentlichers |
Localização | Área/Cota |
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Institute for Contemporary History (Munich) | Bitte rufen Sie die Einzelbaende auf; dieser Titel ist ein mehrbaendiges Werk. |
Internet |
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URL des Erstveröffentlichers |