Measuring economic downside risk and severity : growth at risk

Measuring economic downside risk and severity : growth at risk / Yan Wang and Yudong Yao

Using growth at risk as a measure of downside growth risk, the authors find that higher perceived levels of downside growth risk seem to be negatively associated with long-term growth

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Détails bibliographiques
Auteurs principaux:	Wang, Albert Yan
Collectivités auteurs:	World Bank Institute
Autres auteurs:	Yao, Yudong
Format:	Online-Resource
Langue:	English
Publié:	Washington, D.C : World Bank, World Bank Institute, Economic Policy and Poverty Reduction Division, 2001
Collection:	Policy research working paper
Sujets:	Wirtschaftsentwicklung Business cycles Economic development Risk Risk management
Accès en ligne:	URL des Erstveröffentlichers

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Institute for Contemporary History (Munich)	Bitte rufen Sie die Einzelbaende auf; dieser Titel ist ein mehrbaendiges Werk.

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